Course name: IC Testing

Code: ICT

Training content

• IC Testing Introduction – 2 lectures
• IC Testing Process and Equipment – 2 lectures
• Faults and Fault modeling – 2 lectures
• Testability Measures – 2 lectures
• Test Pattern Generation Algorithms for Combination Circuits – 2 lectures
• IC Quiescent Current (IDDQ) Testing – 2 lectures
• Design for Testability – 3 lectures
• Built-in Self Testing (BIST) – 2 lectures
• Memory IC Testing – 2 lectures
• System Level Test Techniques – 2 lectures
• Analog and Mixed Signal Testing – 2 lectures

Training purpose

• General knowledge and practice of DFT and Built-in self test

References

• VLSI Test Principles and Architectures: Design for Testability